We propose a van der Pol type self-excited micro-cantilever probe for AFM (atomic force microscope). Because the response frequency of self-excited oscillators is its natural frequency, the equivalent natural frequency depending on the atomic force is easily measured from detecting the response frequency of the self-excited micro-cantilever probe. While the amplitude of the linear self-excited oscillator grows with time, it can be kept very small by the nonlinear effect as van ver Pol oscillator. Therefore, if the micro-cantilever probe has the same dynamics as that of van Pol oscillator, the contact of the micro-cantilever to the material surface is prohibited and non-contact mode AFM is realized. In the present study, we design a van der Pol type micro-cantilever for the application to the practical AFM system.
- Design Engineering Division and Computers in Engineering Division
Van der Pol Type Self-Excited Microcantilever and Its Application to AFM
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Yabuno, H, Kuroda, M, Someya, T, Ohta, M, & Kokawa, R. "Van der Pol Type Self-Excited Microcantilever and Its Application to AFM." Proceedings of the ASME 2009 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. Volume 4: 7th International Conference on Multibody Systems, Nonlinear Dynamics, and Control, Parts A, B and C. San Diego, California, USA. August 30–September 2, 2009. pp. 1755-1758. ASME. https://doi.org/10.1115/DETC2009-86690
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