Most damage growth models require accurate stress intensity factor as well as model parameters for predicting damage growth. Depending on geometries and loading conditions, these models become complicated with additional model parameters. This paper shows that a simple model, such as the Paris model, can be used for complex geometries by compensating the error in stress intensity factor with the equivalent model parameters that are different from the true ones. Actual damage growth is simulated using the extended finite element method to model the effects of crack location and geometry on the relationship between crack size and stress intensity factor. The detection process of crack using structural health monitoring systems is modeled by adding random noise and a deterministic bias. The equivalent model parameters are then identified using the least-square-filtered Bayesian method, from which the remaining useful life is estimated. Using three examples, it is shown that the RUL estimates are accurate even when an inaccurate stress intensity factor is used.
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ASME 2011 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
August 28–31, 2011
Washington, DC, USA
Conference Sponsors:
- Design Engineering Division and Computers and Information in Engineering Division
ISBN:
978-0-7918-5479-2
PROCEEDINGS PAPER
Equivalent Damage Growth Parameters Using a Simplified Model
Alexandra Coppe,
Alexandra Coppe
University of Florida, Gainesville, FL
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Matthew J. Pais,
Matthew J. Pais
University of Florida, Gainesville, FL
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Raphael T. Haftka,
Raphael T. Haftka
University of Florida, Gainesville, FL
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Nam H. Kim
Nam H. Kim
University of Florida, Gainesville, FL
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Alexandra Coppe
University of Florida, Gainesville, FL
Matthew J. Pais
University of Florida, Gainesville, FL
Raphael T. Haftka
University of Florida, Gainesville, FL
Nam H. Kim
University of Florida, Gainesville, FL
Paper No:
DETC2011-48801, pp. 1317-1328; 12 pages
Published Online:
June 12, 2012
Citation
Coppe, A, Pais, MJ, Haftka, RT, & Kim, NH. "Equivalent Damage Growth Parameters Using a Simplified Model." Proceedings of the ASME 2011 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. Volume 2: 31st Computers and Information in Engineering Conference, Parts A and B. Washington, DC, USA. August 28–31, 2011. pp. 1317-1328. ASME. https://doi.org/10.1115/DETC2011-48801
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