X-ray computed tomography (CT) can nondestructively inspect an object and can clearly, accurately, and intuitively display its internal structure, composition, texture, and damage. In industry this technology was initially used for material analysis and nondestructive testing and evaluation. Recently, as an alternative to optical and tactile measurement devices, CT has entered industrial use for dimensional metrology. Unfortunately, industrial-level accuracy is very difficult to attain with CT for various reasons. In this paper we analyze one of the most serious effects, the Feldkamp–Davis–Kress (FDK) effect, which can be observed in most of the common X-ray CT scanners with a cone beam. The FDK is the reconstruction algorithm widely accepted as a standard reconstruction method for cone-beam type of CT because of its computation efficiency. However, this algorithm merely provides an approximate result. An accurate measurement result can be obtained only in the case of small cone angle. We aim at analyzing the FDK effect independently from other kinds of artifacts. In a practical CT scanning situation, various kinds of artifacts appear in the reconstruction results; thus, we apply a simulation to obtain projection images without noise (scattering, beam hardening, etc.). Then, the FDK algorithm is applied to these projection images to reconstruct CT images so that only the FDK effect can be observed in the reconstructed CT images. Based on this approach, we conducted quantitative analysis on the FDK effect using numerical phantoms of the sphere and stepped cylinders that may be adopted as ISO reference standards for dimensional metrology using X-ray CT scanners. This paper describes the evaluation workflow and discusses the cause of the FDK effect on the measurement of the sphere and the stepped cylinders. Particular attention is given to the evaluation of the error distribution feature on different spatial positions. After discussing the error feature, a method for improving measurement accuracy is proposed.
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June 2015
Research-Article
Numerical Analysis of the Feldkamp–Davis–Kress Effect on Industrial X-Ray Computed Tomography for Dimensional Metrology
Lin Xue,
Lin Xue
RCAST,
Tokyo 1538904,
e-mail: mechanicalautomaticxue@gmail.com
The University of Tokyo
,7-3-1, Hongo, Bunkyo
,Tokyo 1538904,
Japan
e-mail: mechanicalautomaticxue@gmail.com
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Hiromasa Suzuki,
Hiromasa Suzuki
RCAST,
Tokyo 1538904,
The University of Tokyo
,7-3-1, Hongo, Bunkyo
,Tokyo 1538904,
Japan
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Yutaka Ohtake,
Yutaka Ohtake
RCAST,
Tokyo 1538904,
The University of Tokyo
,7-3-1, Hongo, Bunkyo
,Tokyo 1538904,
Japan
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Hiroyuki Fujimoto,
Hiroyuki Fujimoto
National Metrology Institute of Japan,
National Institute of Advanced Industrial
National Institute of Advanced Industrial
Science and Technology (AIST)
,Tsukuba, Ibaraki 305-8563
, Japan
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Makoto Abe,
Makoto Abe
National Metrology Institute of Japan,
National Institute of Advanced Industrial
National Institute of Advanced Industrial
Science and Technology (AIST)
,Tsukuba, Ibaraki 305-8563
, Japan
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Osamu Sato,
Osamu Sato
National Metrology Institute of Japan,
National Institute of Advanced Industrial
National Institute of Advanced Industrial
Science and Technology (AIST)
,Tsukuba, Ibaraki 305-8563
, Japan
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Toshiyuki Takatsuji
Toshiyuki Takatsuji
National Metrology Institute of Japan,
National Institute of Advanced Industrial
National Institute of Advanced Industrial
Science and Technology (AIST)
,Tsukuba, Ibaraki 305-8563
, Japan
Search for other works by this author on:
Lin Xue
RCAST,
Tokyo 1538904,
e-mail: mechanicalautomaticxue@gmail.com
The University of Tokyo
,7-3-1, Hongo, Bunkyo
,Tokyo 1538904,
Japan
e-mail: mechanicalautomaticxue@gmail.com
Hiromasa Suzuki
RCAST,
Tokyo 1538904,
The University of Tokyo
,7-3-1, Hongo, Bunkyo
,Tokyo 1538904,
Japan
Yutaka Ohtake
RCAST,
Tokyo 1538904,
The University of Tokyo
,7-3-1, Hongo, Bunkyo
,Tokyo 1538904,
Japan
Hiroyuki Fujimoto
National Metrology Institute of Japan,
National Institute of Advanced Industrial
National Institute of Advanced Industrial
Science and Technology (AIST)
,Tsukuba, Ibaraki 305-8563
, Japan
Makoto Abe
National Metrology Institute of Japan,
National Institute of Advanced Industrial
National Institute of Advanced Industrial
Science and Technology (AIST)
,Tsukuba, Ibaraki 305-8563
, Japan
Osamu Sato
National Metrology Institute of Japan,
National Institute of Advanced Industrial
National Institute of Advanced Industrial
Science and Technology (AIST)
,Tsukuba, Ibaraki 305-8563
, Japan
Toshiyuki Takatsuji
National Metrology Institute of Japan,
National Institute of Advanced Industrial
National Institute of Advanced Industrial
Science and Technology (AIST)
,Tsukuba, Ibaraki 305-8563
, Japan
Contributed by the Computers and Information Division of ASME for publication in the JOURNAL OF COMPUTING AND INFORMATION SCIENCE IN ENGINEERING. Manuscript received September 26, 2014; final manuscript received October 5, 2014; published online April 8, 2015. Editor: Bahram Ravani.
J. Comput. Inf. Sci. Eng. Jun 2015, 15(2): 021008 (8 pages)
Published Online: June 1, 2015
Article history
Received:
September 26, 2014
Revision Received:
October 5, 2014
Online:
April 8, 2015
Citation
Xue, L., Suzuki, H., Ohtake, Y., Fujimoto, H., Abe, M., Sato, O., and Takatsuji, T. (June 1, 2015). "Numerical Analysis of the Feldkamp–Davis–Kress Effect on Industrial X-Ray Computed Tomography for Dimensional Metrology." ASME. J. Comput. Inf. Sci. Eng. June 2015; 15(2): 021008. https://doi.org/10.1115/1.4028942
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