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Issues
September 1997
ISSN 1043-7398
EISSN 1528-9044
In this Issue
Technical Papers
Maximizing Solder Joint Reliability Through Optimal Shape Design
J. Electron. Packag. September 1997, 119(3): 149–155.
doi: https://doi.org/10.1115/1.2792227
The Nature of Centroidal Locus in Misaligned Flip-Chip Solder Joints
J. Electron. Packag. September 1997, 119(3): 156–162.
doi: https://doi.org/10.1115/1.2792228
Topics:
Flip-chip
,
Solder joints
,
Cross section (Physics)
,
Three-dimensional models
,
Design
,
Optoelectronic devices
,
Shapes
Nonlinear Analysis of Full-Matrix and Perimeter Plastic Ball Grid Array Solder Joints
J. Electron. Packag. September 1997, 119(3): 163–170.
doi: https://doi.org/10.1115/1.2792229
Gull-Wing Solder Joint Fatigue Life Sensitivity Evaluation
J. Electron. Packag. September 1997, 119(3): 171–176.
doi: https://doi.org/10.1115/1.2792230
Topics:
Fatigue life
,
Solder joints
,
Wings
,
Manufacturing
,
Solders
,
Design
,
Modeling
,
Diluents
,
Finite element analysis
,
Finite element model
A Nonlinear Multi-Domain Thermomechanical Stress Analysis Method for Surface-Mount Solder Joints—Part II: Viscoplastic Analysis
J. Electron. Packag. September 1997, 119(3): 177–182.
doi: https://doi.org/10.1115/1.2792231
Stress Analysis of Surface-Mount Interconnections Due to Vibrational Loading
J. Electron. Packag. September 1997, 119(3): 183–188.
doi: https://doi.org/10.1115/1.2792232
Deformation Mechanism of Two-Phase Solder Column Interconnections Under Highly Accelerated Thermal Cycling Condition: An Experimental Study
J. Electron. Packag. September 1997, 119(3): 189–196.
doi: https://doi.org/10.1115/1.2792233
Topics:
Deformation
,
Solders
,
Cycles
,
Manufacturing
,
Ceramics
,
Displacement
,
Interferometry
,
Reliability
,
Shapes
,
Thermomechanics
Warpage and Interfacial Stress Distribution in a Single-Level Integrated Module (SLIM)
J. Electron. Packag. September 1997, 119(3): 197–203.
doi: https://doi.org/10.1115/1.2792234
Topics:
Stress concentration
,
Warping
,
Thermomechanics
,
Delamination
,
Design
,
Dielectric materials
,
Electronic components
,
Failure
,
Shear (Mechanics)
,
Stress
Determination of Fracture Toughness of Thermally Conductive Adhesives
J. Electron. Packag. September 1997, 119(3): 204–207.
doi: https://doi.org/10.1115/1.2792235
Topics:
Adhesives
,
Fracture toughness
Thermal and Mechanical Evaluations of a Cost-Effective Plastic Ball Grid Array Package
J. Electron. Packag. September 1997, 119(3): 208–212.
doi: https://doi.org/10.1115/1.2792236
Book Reviews
Applied Probability for Engineers and Scientists
J. Electron. Packag. September 1997, 119(3): 213–214.
doi: https://doi.org/10.1115/1.2792237
Topics:
Engineers
,
Probability
Modern Solder Technology for Competitive Electronics Manufacturing
J. Electron. Packag. September 1997, 119(3): 214–215.
doi: https://doi.org/10.1115/1.2792238
Topics:
Electronics
,
Manufacturing
,
Solders
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