1-20 of 175
Keywords: finite element analysis
Close
Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Journal Articles
Publisher: ASME
Article Type: Research-Article
J. Electron. Packag. September 2023, 145(3): 031010.
Paper No: EP-22-1063
Published Online: June 23, 2023
.... , Oyewola , D. O. , and Khammas , B. M. , 2022 , “ Metaheuristic Algorithms for PID Controller Parameters Tuning: Review, Approaches and Open Problems ,” Heliyon , 8 ( 5 ), p. e09399 . 10.1016/j.heliyon.2022.e09399 [18] Moaveni, S., 2011 , Finite Element Analysis—Theory...
Journal Articles
Publisher: ASME
Article Type: Research-Article
J. Electron. Packag. December 2022, 144(4): 041005.
Paper No: EP-21-1036
Published Online: November 22, 2021
... structure through manufacturing. The reliability of the leadless package structure after silver paste sintering was verified by finite element analysis, and the results showed that the thermal stress caused by high and low-temperature cycles in the leadless package is minimal and does not affect...
Journal Articles
Publisher: ASME
Article Type: Research-Article
J. Electron. Packag. March 2022, 144(1): 011001.
Paper No: EP-20-1071
Published Online: August 6, 2021
... 2021 3D-ICs packaging through silicon via finite element analysis fatigue lifespan estimation Ministry of Science and Technology, Taiwan 10.13039/501100004663 MOST 106-2221-E-007-126-MY3 Advanced packaging technologies with high-density nanoscaled transistors need...
Journal Articles
Publisher: ASME
Article Type: Research-Article
J. Electron. Packag. June 2020, 142(2): 021007.
Paper No: EP-19-1085
Published Online: March 9, 2020
... 03 01 2020 09 03 2020 flexible electronics wearable smart shirt serpentine conductor mechanical evaluation finite element analysis The transition from rigid to flexible electronic devices in the recent years has significantly expanded the electronic device applications...
Journal Articles
Publisher: ASME
Article Type: Research-Article
J. Electron. Packag. June 2019, 141(2): 021008.
Paper No: EP-18-1073
Published Online: April 10, 2019
.... In the models of straight and barrel interconnects as the typical solder bumps in modern flip-chip technology, the critical current density is predicted through calculating electrical potential by proposed formulation and simulation based on the finite element analysis (FEA). The critical current density...
Journal Articles
Journal Articles
Publisher: ASME
Article Type: Research-Article
J. Electron. Packag. December 2012, 134(4): 041005.
Published Online: October 30, 2012
... filled with interface material) on the resulting thermal-structural response is investigated with respect to four interface materials combinations, and it is found that the thermal performance is most sensitive to the slot-depth compared to any other parameter. pin fin finite element analysis...
Journal Articles
Publisher: ASME
Article Type: Research-Article
J. Electron. Packag. September 2012, 134(3): 031007.
Published Online: July 18, 2012
... finite element analysis The ACA is extensively used in the electronic packaging applications due to the advantages of fine pitch capacity, process simplicity, and environmental compatibility [ 1 ]. However, some issues, such as low conductivity and bad reliability of ACA joints, greatly limit its...
Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Electron. Packag. December 2011, 133(4): 041015.
Published Online: December 23, 2011
... at micrometer level has not been possible using conventional techniques. In the present study, an efficient and accurate multi-level thermal modeling and analysis technique has been developed. The technique combines finite element analysis sub-modeling and a superposition method for more efficient modeling...
Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Electron. Packag. December 2011, 133(4): 041013.
Published Online: December 19, 2011
... experiments were conducted in parallel and experimental results were compared to simulations. Prediction discrepancies were analyzed and explanations suggested. 29 06 2010 19 10 2011 19 12 2011 19 12 2011 electronics packaging finite element analysis hardening semiconductor...
Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Electron. Packag. December 2011, 133(4): 041004.
Published Online: December 9, 2011
... they are stiffer than solder. Therefore, the all-copper-connection was selected in this work to investigate the modeling aspects and simplifications in high density flip-chip connections. finite element analysis flip-chip devices optimisation 28 05 2010 24 08 2011 09 12 2011 09 12...
Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Electron. Packag. December 2011, 133(4): 041012.
Published Online: December 9, 2011
... 2010 13 04 2011 09 12 2011 09 12 2011 assembling electron device manufacture electronic products finite element analysis reliability transient response vibrations Designers have long realized the benefits of effective modeling and simulation during the design cycle...
Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Electron. Packag. December 2011, 133(4): 041010.
Published Online: December 9, 2011
... )]. These empirical results will be used in future work to develop and calibrate finite element analysis (FEA) methodology for dynamic response analysis, to facilitate durability assessment under shock and drop excitation. The rest of this paper is organized as follows: first system under study is described...
Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Electron. Packag. September 2011, 133(3): 031004.
Published Online: September 14, 2011
... the crack driving force in it and consequently alleviates the risk of the intermetallic compound layer fracturing. 05 02 2011 22 06 2011 14 09 2011 14 09 2011 electronics packaging failure analysis finite element analysis solders solder joint intermetallic compounds...
Journal Articles
Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Electron. Packag. March 2011, 133(1): 011005.
Published Online: March 9, 2011
... is briefly exposed and the method is applied to some two-layer virtual structures. The obtained results are compared with those obtained using standard FEM analyses. electronics packaging finite element analysis power electronics thermal analysis The first step (S1D) will consider a one...
Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Electron. Packag. December 2010, 132(4): 041011.
Published Online: December 8, 2010
... is presented, damage propagation path and pattern are compared with typical experimental results, and the accuracy of the model was verified. 17 03 2010 08 07 2010 08 12 2010 08 12 2010 fatigue cracks finite element analysis solders viscoplasticity Low cycle fatigue...
Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Electron. Packag. June 2010, 132(2): 021007.
Published Online: June 25, 2010
... modeling, that address the nature of the singular solutions at the crack tip and provide insight when dealing with the more complex problem of solder joint fracture. Using three-dimensional finite element analysis of a chip scale package, we systematically examine the stress-strain behavior at the edge...
Journal Articles
Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Electron. Packag. March 2010, 132(1): 011006.
Published Online: March 19, 2010
... properties, fillet height, and silicon die thickness on the interface delamination between epoxy molding compound and silicon die during a lead-free solder reflow process based on the modified virtual crack closure method. Based on finite element analysis and experiment study, it can be concluded...