A technique is presented for recovering the temperature profile in semitransparent solids from remotely sensed spectral emission data. The temperature distribution is determined by iteratively solving the equation governing the emerging spectral emission to recover the profile to best match the emission data. The technique is evaluated using both analytical and experimental emission data. Analytical results show the effect of data error, number of data points, method of representing the temperature profile, and optical thickness range. The method is verified experimentally using Corning Code 7940 fused quartz by comparing recovered temperature profiles with those predicted by a combined conduction-radiation heat-transfer analysis.
Issue Section:
Research Papers
This content is only available via PDF.
Copyright © 1974
by ASME
You do not currently have access to this content.
