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Santiago D. Solares
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Proceedings Papers

Approximate Real-Time Force Spectroscopy Within Amplitude-Modulation Atomic Force Microscopy Topographical Imaging Using Few Harmonics and Fourier Methods

Berkin Uluutku, Santiago D. Solares
Proc. ASME. IDETC-CIE2021, Volume 11: 15th International Conference on Micro- and Nanosystems (MNS), V011T11A006, August 17–19, 2021
Publisher: American Society of Mechanical Engineers
Paper No: DETC2021-67205
https://doi.org/10.1115/DETC2021-67205
View Paper titled, Approximate Real-Time Force Spectroscopy Within Amplitude-Modulation Atomic Force Microscopy Topographical Imaging Using Few Harmonics and Fourier Methods
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Topics: Atomic force microscopy, Fourier analysis, Imaging, Spectroscopy
Proceedings Papers

Subatomic Resolution in Noncontact Atomic Force Microscopy: Electron Cloud Interactions or Harmonics Processing Artifacts?

C. Alan Wright, Santiago D. Solares
Proc. ASME. IDETC-CIE2012, Volume 5: 6th International Conference on Micro- and Nanosystems; 17th Design for Manufacturing and the Life Cycle Conference, 329-334, August 12–15, 2012
Publisher: American Society of Mechanical Engineers
Paper No: DETC2012-70397
https://doi.org/10.1115/DETC2012-70397
View Paper titled, Subatomic Resolution in Noncontact Atomic Force Microscopy: Electron Cloud Interactions or Harmonics Processing Artifacts?
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Topics: Atomic force microscopy, Electron clouds, Resolution (Optics), Atoms, Bonding, Computational methods, Density functional theory, Electrons, Engineering simulation, Filtration
Proceedings Papers

Exploring Dynamic Non-Idealities in Multi-Frequency Atomic Force Microscopy

Santiago D. Solares
Proc. ASME. IDETC-CIE2012, Volume 5: 6th International Conference on Micro- and Nanosystems; 17th Design for Manufacturing and the Life Cycle Conference, 291-296, August 12–15, 2012
Publisher: American Society of Mechanical Engineers
Paper No: DETC2012-70098
https://doi.org/10.1115/DETC2012-70098
View Paper titled, Exploring Dynamic Non-Idealities in Multi-Frequency Atomic Force Microscopy
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Topics: Atomic force microscopy, Dynamics (Mechanics), Imaging, Errors, Materials properties, Mechanical engineers, Nanoscale phenomena
Proceedings Papers

Utilization of Simple Scaling Laws for Modulating Tip-Sample Interaction Forces in Aqueous Environment AFM Characterization: Application to the Self-Assembly of Protein Polymers

Santiago D. Solares, Jonathan Chang, Joonil Seog, Adam U. Kareem
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 469-473, August 28–31, 2011
Publisher: American Society of Mechanical Engineers
Paper No: DETC2011-47199
https://doi.org/10.1115/DETC2011-47199
View Paper titled, Utilization of Simple Scaling Laws for Modulating Tip-Sample Interaction Forces in Aqueous Environment AFM Characterization: Application to the Self-Assembly of Protein Polymers
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Topics: Atomic force microscopy, Polymers, Proteins, Scaling laws (Mathematical physics), Self-assembly, Nanofibers, Simulation, Block copolymers, Harmonic oscillators, Imaging
Proceedings Papers

Trimodal Tapping-Mode Atomic Force Microscopy: A Possible Method for Simultaneous Measurement of Conservative and Dissipative Interactions

Gaurav Chawla, Santiago D. Solares
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 501-506, August 28–31, 2011
Publisher: American Society of Mechanical Engineers
Paper No: DETC2011-47668
https://doi.org/10.1115/DETC2011-47668
View Paper titled, Trimodal Tapping-Mode Atomic Force Microscopy: A Possible Method for Simultaneous Measurement of Conservative and Dissipative Interactions
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Topics: Atomic force microscopy, Cantilevers, Oscillations, Frequency response, Imaging, Stiffness, Surface characterization
Proceedings Papers

3-Dimensional Force Curve and Dissipation Model Acquisition Using the Spectral Inversion Method in Tapping Mode AFM

Jeffrey C. Williams, Santiago D. Solares
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 365-370, August 28–31, 2011
Publisher: American Society of Mechanical Engineers
Paper No: DETC2011-47112
https://doi.org/10.1115/DETC2011-47112
View Paper titled, 3-Dimensional Force Curve and Dissipation Model Acquisition Using the Spectral Inversion Method in Tapping Mode AFM
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Topics: Atomic force microscopy, Energy dissipation, Cantilevers, Excitation, Fourier analysis, Materials properties, Nanoscale phenomena, Nanotechnology, Probes, Q-factor
Proceedings Papers

Numerical Analysis of the Band Excitation AFM Method: Examining the Characteristics of the Excitation Signals and the Corresponding Response Behavior at the Cantilever Tip

Adam U. Kareem, Santiago D. Solares
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 379-385, August 28–31, 2011
Publisher: American Society of Mechanical Engineers
Paper No: DETC2011-47167
https://doi.org/10.1115/DETC2011-47167
View Paper titled, Numerical Analysis of the Band Excitation AFM Method: Examining the Characteristics of the Excitation Signals and the Corresponding Response Behavior at the Cantilever Tip
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Topics: Atomic force microscopy, Cantilevers, Excitation, Numerical analysis, Signals, Computer simulation, Dynamics (Mechanics), Nanotechnology
Proceedings Papers

Numerical Analysis of Sub-Atomic AFM Imaging in Ultra-High Vacuum: Coupling Quantum Mechanics With Continuum Dynamics

C. Alan Wright, Santiago D. Solares
Proc. ASME. IDETC-CIE2011, Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference, 459-467, August 28–31, 2011
Publisher: American Society of Mechanical Engineers
Paper No: DETC2011-47082
https://doi.org/10.1115/DETC2011-47082
View Paper titled, Numerical Analysis of Sub-Atomic AFM Imaging in Ultra-High Vacuum: Coupling Quantum Mechanics With Continuum Dynamics
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Topics: Atomic force microscopy, Dynamics (Mechanics), Imaging, Numerical analysis, Quantum mechanics, Vacuum, Atoms, Bonding, Density, Tungsten
Proceedings Papers

Enhanced Topographical Characterization of Sharp Step Edges With Simultaneous AFM Imaging and Force Spectroscopy

Santiago D. Solares
Proc. ASME. IDETC-CIE2010, Volume 4: 12th International Conference on Advanced Vehicle and Tire Technologies; 4th International Conference on Micro- and Nanosystems, 461-467, August 15–18, 2010
Publisher: American Society of Mechanical Engineers
Paper No: DETC2010-28099
https://doi.org/10.1115/DETC2010-28099
View Paper titled, Enhanced Topographical Characterization of Sharp Step Edges With Simultaneous AFM Imaging and Force Spectroscopy
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Topics: Atomic force microscopy, Imaging, Spectroscopy, Membrane electrode assemblies, Carbon nanotubes, Engineering simulation, Inventions, Nanowires, Probes, Simulation
Journal Articles

Utilizing Off-Resonance and Dual-Frequency Excitation to Distinguish Attractive and Repulsive Surface Forces in Atomic Force Microscopy

Andrew J. Dick, Santiago D. Solares
Journal: Journal of Computational and Nonlinear Dynamics
Publisher: ASME
Article Type: Research Papers
J. Comput. Nonlinear Dynam. July 2011, 6(3): 031005.
https://doi.org/10.1115/1.4002341
Published Online: December 16, 2010
View Article titled, Utilizing Off-Resonance and Dual-Frequency Excitation to Distinguish Attractive and Repulsive Surface Forces in Atomic Force Microscopy
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Topics: Atomic force microscopy, Excitation, Probes, Separation (Technology), Resonance, Cantilevers
Proceedings Papers

Computational Development of Single- and Dual-Frequency Modulation Atomic Force Spectroscopy for Ambient Air Applications

Gaurav Chawla, Santiago D. Solares
Proc. ASME. IDETC-CIE2009, Volume 6: ASME Power Transmission and Gearing Conference; 3rd International Conference on Micro- and Nanosystems; 11th International Conference on Advanced Vehicle and Tire Technologies, 707-716, August 30–September 2, 2009
Publisher: American Society of Mechanical Engineers
Paper No: DETC2009-86844
https://doi.org/10.1115/DETC2009-86844
View Paper titled, Computational Development of Single- and Dual-Frequency Modulation Atomic Force Spectroscopy for Ambient Air Applications
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Topics: Fundamental forces (Physics), Spectroscopy, Atomic force microscopy, Computer simulation, Mechanical behavior, Nanoscale phenomena
Proceedings Papers

Calculation of Isothermal Intrinsic Compressibility and Compression of GvpA Protein in Halobacterium sp. NRC-1 Using Molecular Modeling and Dynamics

Hussein M. EzzEldin, Santiago D. Solares
Proc. ASME. IDETC-CIE2009, Volume 6: ASME Power Transmission and Gearing Conference; 3rd International Conference on Micro- and Nanosystems; 11th International Conference on Advanced Vehicle and Tire Technologies, 389-395, August 30–September 2, 2009
Publisher: American Society of Mechanical Engineers
Paper No: DETC2009-86265
https://doi.org/10.1115/DETC2009-86265
View Paper titled, Calculation of Isothermal Intrinsic Compressibility and Compression of GvpA Protein in Halobacterium sp. NRC-1 Using Molecular Modeling and Dynamics
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Topics: Compressibility, Compression, Dynamics (Mechanics), Modeling, Proteins, Pressure, Membranes, Simulation, Temperature, Buoyancy
Journal Articles

Exploration of AFM Imaging Artifacts Occurring at Sharp Surface Features When Using Short Carbon Nanotube Probes and Possible Mitigation With Real-Time Force Spectroscopy

Santiago D. Solares, Gaurav Chawla
Journal: Journal of Manufacturing Science and Engineering
Publisher: ASME
Article Type: Special Issue On Nanomanufacturing
J. Manuf. Sci. Eng. June 2010, 132(3): 030904.
https://doi.org/10.1115/1.4001579
Published Online: May 13, 2010
View Article titled, Exploration of AFM Imaging Artifacts Occurring at Sharp Surface Features When Using Short Carbon Nanotube Probes and Possible Mitigation With Real-Time Force Spectroscopy
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Topics: Atomic force microscopy, Cantilevers, Imaging, Probes, Spectroscopy, Carbon nanotubes, Oscillations