Fig. 5
![(a) A TEM image of the tip apex immediately before contact is made, with the crystallographic orientation and loading direction identified. (b) An MD model was made of the lowermost 10 nm of the tip shown in (a) that includes both the crystalline Si and amorphous Si (a-Si) material. (c) A cross-sectional image of the same MD model illustrates the matching of the crystallographic orientation and loading direction. Reproduced with permission from Vishnubhotla et al. [103]. Copyright 2017 by Springer.](https://asmedc.silverchair-cdn.com/asmedc/content_public/journal/appliedmechanicsreviews/69/6/10.1115_1.4038130/10/amr_069_06_060802_f005.png?Expires=1717068295&Signature=WNgsUxu-E0cY~Ub~x5zP~hNMnrysZMO4fx~Bb7t1-99xQ6xTELNTmyAPre6jQ3daAKdiXqCAQzLzh5gM5iDebryP1fb9WdaLpEcqvGIZPfVSnVh3o0lzLwK~Yms9221ck79HLLjcupRsCE-w0KzFPEXSKk8HV9xt8LrV5MRpTi-d~yUVBmRBlBEBgAfYs6lDk6TRI4gF0iN2fLMAWUpZ0Iii~j-lp3m~6q8GiS6pFxY1NmQVm5DvbkBRC1wZ0yWKG8hkKG3eNQ6r-OG~eek9X45FZQkAAzBZt-CTxLioOPF~xvqWcPPbrcjz72GAOUxDlYlmVCZmqEaa5o4IcJpwqA__&Key-Pair-Id=APKAIE5G5CRDK6RD3PGA)
(a) A TEM image of the tip apex immediately before contact is made, with the crystallographic orientation and loading direction identified. (b) An MD model was made of the lowermost 10 nm of the tip shown in (a) that includes both the crystalline Si and amorphous Si (a-Si) material. (c) A cross-sectional image of the same MD model illustrates the matching of the crystallographic orientation and loading direction. Reproduced with permission from Vishnubhotla et al. [103]. Copyright 2017 by Springer.
